Optimal+, a global big data analytics provider for the semiconductor industry, announced that it has collaborated with NI, a leading provider of platform-based test systems that enable engineers and scientists to solve the world’s greatest engineering IoT challenges, so that the entire suite of solutions from Optimal+ will be supported by NI’s Semiconductor Test System (STS)via the Optimal+ Proxy starting in Q1 2016.

The Internet of Things (IoT) will drive explosive growth in the semiconductor industry and semiconductor companies are looking for every edge to increase productivity and efficiency while maintaining high quality manufacturing and maximizing product yield. Optimal+ will supply their real-time solutions on the STS to maximize production efficiency on the manufacturing floor. Optimal+ solutions are already in full production use at leading IDMs, OSATs, and fabless companies, enabling them to optimize their manufacturing supply chain based on the industry’s most complete, high-integrity test data. The ability to analyze data on the open, modular architecture of the STS will reduce hardware test costs, improve throughput and increase overall quality.

“Semiconductor companies are striving to increase productivity, thus the focus on reducing test time and increasing throughput. This has increased the adoption of both the NI Semiconductor Test System (STS) and the Big Data Analytics solutions from Optimal+ in the semiconductor manufacturing space over the past few years,” said Jessy Cavazos, Industry Director of Test & Measurement at Frost & Sullivan. “The STS’s open and modular software and hardware facilitates the integration of Optimal+ software adding significant value to customers. By collaborating together, NI and Optimal+ are enabling semiconductor customers to take production, productivity, and product quality to new heights, a sector in which single digit improvements can save millions of dollars.”

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